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  4. Characteristics of fritting contacts utilized for micromachined wafer probe cards
 
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2000
Journal Article
Title

Characteristics of fritting contacts utilized for micromachined wafer probe cards

Author(s)
Itoh, T.
Suga, T.
Engelmann, G.
Wolf, J.
Ehrmann, O.
Reichl, H.
Journal
Review of scientific instruments  
DOI
10.1063/1.1150610
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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