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  4. Substrateless sensor packaging using wafer level fan-out technology
 
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2012
Conference Paper
Title

Substrateless sensor packaging using wafer level fan-out technology

Abstract
In this paper, we present the application of a substrateless packaging technology consisting of sub sequential molding of ASIC and MEMS dice und forming redistribution layers (RDL) on the molding compound. Acceleration sensors and pressure sensors were packaged, each sensor type presenting its own challenges. For pressure sensors it is crucial to ensure the access of the surrounding media to the pressure sensitive membrane. This was achieved by structuring the redistribution layer without changing the process, making the application of standard equipment and materials relatively easy. The acceleration sensors needed to be modified by trough silicon vias to fit the packaging process. For the redistribution layer, a novel approach was evaluated in parallel to the standard thin-film technology for the acceleration sensor package. All sensor packages fabricated by the process have been found to be within the specifications of standard packages using the same MEMS dice.
Author(s)
Briindel, Matthias
Scholz, U.
Haag, F.
Graf, E.
Braun, Tanja  
Becker, Karl-Friedrich  
Mainwork
IEEE 14th Electronics Packaging Technology Conference, EPTC 2012. Proceedings  
Conference
Electronics Packaging Technology Conference (EPTC) 2012  
DOI
10.1109/EPTC.2012.6507124
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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