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Accessing OLED emitter properties by radiation pattern analysis
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2012
Conference Paper
Title
Accessing OLED emitter properties by radiation pattern analysis
Title Supplement
Abstract
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Author(s)
Danz, Norbert
Flämmich, Michael
Michaelis, Dirk
Schmidt, Tobias
Brütting, Wolfgang
Mainwork
International Conference on Simulation of Organic Electronics and Photovoltaics, SimOEP 2012. Book of Abstracts
Conference
International Conference on Simulation of Organic Electronics and Photovoltaics (SimOEP) 2012
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
