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Accessing OLED emitter properties by radiation pattern analysis
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2012
Conference Paper
Titel
Accessing OLED emitter properties by radiation pattern analysis
Titel Supplements
Abstract
Author(s)
Danz, Norbert
Flämmich, Michael
Michaelis, Dirk
Schmidt, Tobias
Brütting, Wolfgang
Hauptwerk
International Conference on Simulation of Organic Electronics and Photovoltaics, SimOEP 2012. Book of Abstracts
Konferenz
International Conference on Simulation of Organic Electronics and Photovoltaics (SimOEP) 2012
Language
English
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Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF
