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  4. Stress-driven oxidation chemistry of wet silicon surfaces
 
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2008
Journal Article
Title

Stress-driven oxidation chemistry of wet silicon surfaces

Abstract
The formation of a hydroxylated native oxide layer on Si(001) under wet conditions is studied by means of first principles molecular dynamics simulations. Water molecules are found to adsorb and dissociate on the oxidized surface leading to rupture of Si-O bonds and producing reactive sites for attack by dissolved dioxygen or hydrogen peroxide molecules. Tensile strain is found to enhance the driving force for the dissociative adsorption of water, suggesting that similar reactions could be responsible for environmentally driven subcritical crack propagation in silicon.
Author(s)
Colombi Ciacchi, L.
Cole, D.J.
Payne, M.C.
Gumbsch, Peter  
Journal
Journal of physical chemistry. C, Nanomaterials and interfaces  
Open Access
DOI
10.1021/jp804078n
Additional link
Full text
Language
English
Fraunhofer-Institut für Werkstoffmechanik IWM  
Keyword(s)
  • silicon surface

  • MEMS

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