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Characterization of hard disk substrates (NiP/Al, glass) using XPS
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2000
Journal Article
Title
Characterization of hard disk substrates (NiP/Al, glass) using XPS
Author(s)
Ochs, D.
Dieckhoff, S.
Cord, B.
Journal
Surface and Interface Analysis
DOI
10.1002/1096-9918(200008)30:1<12::AID-SIA770>3.0.CO;2-B
Language
English
Fraunhofer-Institut für Fertigungstechnik und Angewandte Materialforschung IFAM
