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  4. Packaging and modular assembly of large-area and fine-pitch 2-D ultrasonic transducer arrays
 
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2013
Journal Article
Title

Packaging and modular assembly of large-area and fine-pitch 2-D ultrasonic transducer arrays

Abstract
A promising transducer architecture for largearea arrays employs 2-D capacitive micromachined ultrasound transducer (CMUT) devices with backside trench-frame pillar interconnects. Reconfigurable array (RA) application-specified integrated circuits (ASICs) can provide efficient interfacing between these high-element-count transducer arrays and standard ultrasound systems. Standard electronic assembly techniques such as flip-chip and ball grid array (BGA) attachment, along with organic laminate substrate carriers, can be leveraged to create large-area arrays composed of tiled modules of CMUT chips and interface ASICs. A large-scale, fully populated and integrated 2-D CMUT array with 32 by 192 elements was developed and demonstrates the feasibility of these techniques to yield future large-area arrays. This study demonstrates a flexible and reliable integration approach by successfully combining a simple under-bump metallization (UBM) process and a stacked CMUT/interposer/ ASIC module architecture. The results show high shear strength of the UBM (26.5 g for 70-¿m balls), high interconnect yield, and excellent CMUT resonance uniformity (s = 0.02 MHz). A multi-row linear array was constructed using the new CMUT/interposer/ASIC process using acoustically active trench-frame CMUT devices and mechanical/ nonfunctional Si backside ASICs. Imaging results with the completed probe assembly demonstrate a functioning device based on the modular assembly architecture.
Author(s)
Lin, D.-S.
Wodnicki, R.
Zhuang, X.
Woychik, C.
Thomenius, K.E.
Fisher, R.A.
Mills, D.M.
Byun, A.J.
Burdick, W.
Khuri-Yakub, P.
Bonitz, B.
Davies, T.
Thomas, G.
Otto, B.
Töpper, M.
Fritzsch, T.
Ehrmann, O.
Journal
IEEE transactions on ultrasonics, ferroelectrics and frequency control  
DOI
10.1109/TUFFC.2013.2709
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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