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  4. Integration of real factory variability in AMHS simulations for wafer fabs
 
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2006
Conference Paper
Title

Integration of real factory variability in AMHS simulations for wafer fabs

Abstract
Most of the existing simulations in the area of semiconductor manufacturing are based on feeding rate approaches. Here, exponential distributions are mainly used for fast simulation results. The drawback is that exponential distributions often do not reflect real production conditions well enough. This paper describes results based on other standard types of distributions and on a new scripted move approach, which allows more realistic simulation results. The paper compares the results based on data from AMD's Fab 30.
Author(s)
Glüer, D.
Sturm, R.
Mainwork
12th IFAC Symposium on Information Control Problems in Manufacturing, INCOM' 2006. Vol.1: Information Systems, Control and Interoperability  
Conference
Symposium on Information Control Problems in Manufacturing (INCOM) 2006  
Language
English
Fraunhofer-Institut für Produktionstechnik und Automatisierung IPA  
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