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2017
Poster
Title
Total ionizing dose tests of Power Bipolar Transistors and SiC power devices for JUICE
Title Supplement
Poster presented at European Conference on RADiation Effects on Components and Systems, RADECS 2017, Geneva, Switzerland, 02 - 06 October 2017
Abstract
We present radiation tests performed on Power bipolar transistors, which evaluated concerning their ELDRS sensitivity to TID levels up to 200 krad(Si) with Co60. Additionally a selection of commercial SiC power devices are tested with Co60 at high dose rates to TID levels of 1 Mrad(Si).
Author(s)
File(s)
Rights
Use according to copyright law
Language
English