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  4. Implementation of the metrological characteristics framework using additively manufactured material measures
 
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2024
Conference Paper
Title

Implementation of the metrological characteristics framework using additively manufactured material measures

Abstract
The standard ISO 25178 includes the latest framework for the calibration, verification and performance specification of areal surface topography measuring instruments. The properties that are subject to a comprehensive calibration and directly contribute to the measurement uncertainty, are referenced as metrological characteristics. ISO 25178-600 describes the basic metrological characteristics that can be applied independently from the measuring principle. To map these characteristics, material measures as defined by ISO 25178-70 are applied. This standard defines 24 different types of material measures that, depending on the individual geometry, have been manufactured using a broad variety of subtractive and additive manufacturing technologies. As areal surface topography measurement is more complex than its profile equivalent, for a comprehensive calibration many metrological characteristics need to be determined. Using multiple case studies, we describe opportunities that the additive manufacturing technology via multi-photon polymerization provides for the implementation of the metrological characteristics framework. These case studies illustrate the versatility that additive manufacturing contributes for the generation of material measures and lead to strategies that allow an efficient implementation of a comprehensive areal calibration.
Author(s)
Eifler, Matthias
IU Internationale Hochschule GmbH
Hering-Stratemeier, Julian
Opti-Cal GmbH
Freymann, Georg von  
Fraunhofer-Institut für Techno- und Wirtschaftsmathematik ITWM  
Seewig, Jörg
Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau
Mainwork
Optics and Photonics International Congress 2024  
Conference
Optics and Photonics International Congress 2024  
DOI
10.1117/12.3027185
Language
English
Fraunhofer-Institut für Techno- und Wirtschaftsmathematik ITWM  
Keyword(s)
  • areal measurement

  • calibration

  • measurement uncertainty

  • surface topography measurement

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