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Characterization of small Cu grains using the conical dark-field technique in the transmission electron microscope
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2011
Journal Article
Title
Characterization of small Cu grains using the conical dark-field technique in the transmission electron microscope
Author(s)
Hübner, R.
Engelmann, H.-J.
Zschech, E.
Zschech, E.
Journal
Microscopy and microanalysis
Conference
Microscopy and Microanalysis 2011
DOI
10.1017/S1431927611006374
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Language
English
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