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  4. A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses
 
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2016
Conference Paper
Title

A dedicated illumination for full-field X-ray microscopy with multilayer Laue lenses

Abstract
We present a concept of a dedicated illumination to perform full-field X-ray microscopy with multilayer Laue lenses at laboratory X-ray sources. The basic idea is the application of a focusing X-ray multilayer mirror as condenser optics to provide a quasi-monochromatic and solid illumination, and consequently optimal conditions for the operation of the multilayer Laue lenses. First experimental results demonstrate the proof of this concept.
Author(s)
Niese, Sven
AXO DRESDEN GmbH
Braun, Stefan
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Dietsch, Reiner
AXO DRESDEN GmbH
Gluch, Jürgen
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Holz, Thomas
AXO DRESDEN GmbH
Huber, Norman
HUBER Diffraktionstechnik GmbH & Co. KG, Rimsting
Kubec, Adam
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Zschech, Ehrenfried
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Mainwork
ICXOM 2015, 23rd International Congress on X-ray Optics and Microanalysis  
Project(s)
Master 3D
Funder
Bundesministerium für Bildung und Forschung BMBF (Deutschland)  
Conference
International Congress on X-Ray Optics and Microanalysis (ICXOM) 2015  
DOI
10.1063/1.4961130
Additional full text version
Landing Page
Language
English
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • dedicated illumination

  • full-field X-ray microscopy

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