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An efficient dynamic parallel approach to automatic test pattern generation
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1997
Conference Paper
Title
An efficient dynamic parallel approach to automatic test pattern generation
Author(s)
Dahmen, H.-C.
Gläser, U.
Vierhaus, H.T.
Mainwork
Great Lakes Symposium on VLSI 1997. Proceedings
Conference
Great Lakes Symposium on VLSI (GLSVLSI) 1997
DOI
10.1109/GLSV.1997.580503
Language
English
AIS
