Structural characterisation of (GaAs) surface wire structure by triple axis (X-ray) grazing incidence diffraction

1998

Journal Article

Author(s)

Darowski, N.

Paschke, K.

Pietsch, U.

Wang, K.

Baumbach, G.

Forchel, A.

Lübbert, D.

Baumbach, T.

Journal