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  4. Quantitative Investigation of Quantum Emitter Yield in Drop-Casted Hexagonal Boron Nitride Nanoflakes
 
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2024
Journal Article
Title

Quantitative Investigation of Quantum Emitter Yield in Drop-Casted Hexagonal Boron Nitride Nanoflakes

Abstract
Single photon emitters (SPEs) are a key component for their use as pure photon source in quantum technologies. In this study, we investigate the generation of SPEs from drop-casted hexagonal boron nitride (hBN) nanoflakes, examining the influence of the immersion solution and the source of hBN. We show that, depending on the utilized supplier and solution, the number and quality of the emitters change. We perform a comprehensive optical characterization of the deposited nanoflakes to assess the quality of the generated SPEs. Importantly, we provide quantitative data on SPE yields, highlighting significant variations among solvents and different sources of hBN. We find that hBN from Merck drop-casted in acetone provided the best quality emitters with a g(2) < 0.1 and photoluminescence intensities above 300 kCounts/s. Their number of SPEs among all photon emitters was also the highest, with about 14%, rendering a total yield of about 1.25% of all drop-casted flakes. These numbers hold particular significance when evaluating drop-casting as a practical method for the generation of SPEs and their deposition and incorporation within existing nanophotonic systems. By choosing appropriate solvents and source materials' quality and yield of SPEs can be significantly increased, showcasing further optimization potential for the development of future quantum applications.
Author(s)
Kretzschmar, Tom
Friedrich-Schiller-Universität Jena
Ritter, Sebastian
Friedrich-Schiller-Universität Jena
Kumar, Anand
Friedrich-Schiller-Universität Jena
Vogl, Tobias
Friedrich-Schiller-Universität Jena
Eilenberger, Falk  
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Schmidt, Falko
Friedrich-Schiller-Universität Jena
Journal
ACS applied optical materials  
Funder
European Commission  
Open Access
DOI
10.1021/acsaom.4c00200
Additional link
Full text
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • Drop-Casting

  • Fluorescent Defects

  • Hexagonal Boron Nitride

  • Quantum Technologies

  • Single-Photon Emitters

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