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  4. 4.5 kV SiC junction barrier schottky diodes with low leakage current and high forward current density
 
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2016
Poster
Title

4.5 kV SiC junction barrier schottky diodes with low leakage current and high forward current density

Title Supplement
Poster presented at 11th European Conference on Silicon Carbide & Related Materials, September 25th - 29th, 2016, Halkidiki, Greece
Abstract
High-voltage 4H-SiC Junction Barrier Schottky diodes with a reverse breakdown voltage of over 4.5 kV and a turn-on voltage below 1 V have been fabricated. They achieved a forward current of 5 A at a forward voltage drop of 1.8 V and 20 A at 4.2 V. A low reverse leakage current of 0.3 mA at 1.2 kV and 37 mA at 3.3 kV was measured. The chip size was 7.3 mm x 7.3 mm, the active area 0.25 cm2 and the diode was able to handle a repetitive pulse current density of over 300 A/cm2 without degradation. Floating field rings in combination with a field-stop ring were used as edge termination to reach 73 % of the theoretical breakdown voltage. The epitaxial layer was 32 mm thick, with a nitrogen doping concentration of 1 x 1015 cm-3. The JBS diodes have been manufactured in a 100 mm SiC prototyping line, using well established processing technology, to achieve cost-efficient devices.
Author(s)
Schöck, Johannes
Büttner, Jonas
Rommel, Mathias  orcid-logo
Erlbacher, Tobias  
Bauer, Anton
Project(s)
SPEED  
Funder
European Commission EC  
Conference
European Conference on Silicon Carbide and Related Materials (ECSCRM) 2016  
File(s)
Download (500.66 KB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-394095
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • Junction Barrier Schottky (JBS) Diode

  • DBC-Mounted

  • Floating Field Rings

  • 4H-SiC

  • Leistungselektronik

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