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Thin layers and multilayers of porous silicon X-ray diffraction investigation
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1998
Journal Article
Title
Thin layers and multilayers of porous silicon X-ray diffraction investigation
Author(s)
Buttard, D.
Bellet, D.
Dolino, G.
Baumbach, T.
Journal
Journal of applied physics
DOI
10.1063/1.367438
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP
