Evaluation of Measurement Noise Effects in the Close Environment of Equivalent Near-Field Sources

Based on the surface equivalence principle an equivalent near-field source can be determined by measurements with a near-field scanner. One application is to use the source to simulate the interferences of the device-under-test with other objects in its close environment. Due to a limited signal-to-noise ratio in practical applications, noise adds to the near-field source. Hence, noise effects affect the quality of the simulation results and cause uncertainties. The influence of the noise effects is investigated by a simulative approach with artificially added noise. Two test devices with different a geometric dimension, operating frequency and excited power are evaluated for different characteristics and signal-to-noise ratios to assess the impact of the simulation results. Finally, in a combined simulation an equivalent near-field source will disturb an IoT-device and the voltages at two resistors on the device are examined.