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  4. Breaking Black Box Crypto-Devices Using Laser Fault Injection
 
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2022
Conference Paper
Title

Breaking Black Box Crypto-Devices Using Laser Fault Injection

Abstract
Laser fault injection attacks on hardware implementations are challenging, due to the inherently large parameter space of the fault injection and the unknown underlying implementation of the attacked device. In this work we report details from an exemplary laser fault attack on the AES-based authentication chip Microchip ATAES 132A, which lead to full secret key extraction. In addition we were able to reveal some details of the underlying implementation. This chip claims to feature various countermeasures and tamper detection mechanisms and is therefore a representative candidate for devices to be found in many different applications. On this basis we describe a systematic approach for Laser fault attacks on devices in a black-box scenario. This includes the determination of all relevant attack parameters such as fault locations, timings, and energy settings.
Author(s)
Selmke, Bodo  orcid-logo
Fraunhofer-Institut für Angewandte und Integrierte Sicherheit AISEC  
Strieder, Emanuele  orcid-logo
Fraunhofer-Institut für Angewandte und Integrierte Sicherheit AISEC  
Heyszl, Johann  
Fraunhofer-Institut für Angewandte und Integrierte Sicherheit AISEC  
Freud, S.
Bundesamt für Sicherheit in der Informationstechnik
Damm, T.
Bundesamt für Sicherheit in der Informationstechnik
Mainwork
Foundations and practice of security. 14th International Symposium, FPS 2021  
Conference
International Symposium on Foundations and Practice of Security 2021  
DOI
10.1007/978-3-031-08147-7_6
Language
English
Fraunhofer-Institut für Angewandte und Integrierte Sicherheit AISEC  
Keyword(s)
  • Fault attack

  • Fault injection

  • Laser fault injection

  • Physical device security

  • Security

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