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  4. 3D-Formvermessung mittels Zwei-Wellenlängen-ESPI-Technik
 
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1994
Conference Paper
Title

3D-Formvermessung mittels Zwei-Wellenlängen-ESPI-Technik

Abstract
A system for three-coordinate measurement will be presented which is suitable for the contouring of rough surface objects.The system is based on the combination of the methods of source transformation and wavelength shift.This makes it possible to illuminate and to view the object without shading. The generation of a synthetic wavelength by suitably choosing the difference of the wavelengths allows a variable sensitivity and hence an adjustment to the contour to be measured.The maximum accuracy of the system will be stated.First results with objects having a diameter of less than 5 cms will be shown.
Author(s)
Maack, T.
Notni, G.
Schreiber, W.
Mainwork
95. DGaO-Tagung  
Conference
Deutsche Gesellschaft für Angewandte Optik (Jahrestagung) 1994  
Language
German
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • contouring

  • Formvermessung

  • optical three-coordinate measurement

  • optische 3D-Koordinatenmessung

  • rauhe Oberfläche

  • rough surface

  • speckle

  • speckle-Interferometrie

  • speckle interferometry

  • two-source method

  • two-wavelength method

  • Zwei-Quellen-Methode

  • Zwei-Wellenlängen-Methode

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