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  4. Interchip Via Technology for Vertical System Integration
 
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2001
Conference Paper
Title

Interchip Via Technology for Vertical System Integration

Abstract
Vertical System Integration(r) means the realization of three-dimensional integrated systems by thinning, stacking and vertical interchip wiring of completely processed and electrically tested device substrates. The Interchip via (ICV) technology is introduced and discussed as a fully CMOS-compatible wafer-scale process, which provides vertical electrical interchip interconnects placed at arbitrary locations without intervention to the IC's fabrication technologies. Thinning of the device substrate (150 mm) down to 10 mu m as well as bonding it to an other silicon wafer had basically no influence on the electrical performance of EEPROM-products and process monitor structures. Resistances of 2 Ohm for a 2 x 2 mu m2 interchip via contact and working contact chains with 480 interchip via contacts are promising results for the future fabrication of multi-layered three-dimensional systems combining the advantages of different device technologies.
Author(s)
Ramm, P.
Bonfert, D.
Gieser, H.
Haufe, J.
Iberl, F.
Klumpp, A.
Kux, A.
Wieland, R.
Mainwork
IEEE 2001 International Interconnect Technology Conference. Proceedings  
Conference
International Interconnect Technology Conference (IITC) 2001  
DOI
10.1109/IITC.2001.930046
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • 3D-Integration

  • wafer stacking

  • wafer thinning

  • vertical system integration (VSI)

  • trench etching

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