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2017
Presentation
Title

Miniaturized NIR spectrometers - state of the art & recent developments

Title Supplement
Presentation held at Workshop "Mikro- und Nanotechnologien für die angewandte Spektroskopie", 17.10.2017, Dresden
Abstract
For non-destructive quality testing near infrared (NIR) spectroscopy in the wavelength range from 1000-2300 nm has become a well established method in various sectors. For example NIR spectroscopy is being applied in food inspection, agriculture, recycling industry, process control and environmental monitoring. Classical, rather bulky bench-top NIR spectrometers are the workhorses in many laboratories. For a more widespread application several approaches using diode detector arrays, filter techniques and digital light processing have been proposed and realized in first products. However, with an increasing demand for on the spot, mobile sensing new development tasks arise. A promising approach for further size and cost reduction for NIR spectrometers is MEMS-technology using silicon based miniaturized components for system realization. We will present state of the art & recent developments in this field.
Author(s)
Reinig, Peter  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Knobbe, Jens  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Pügner, Tino  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Hintschich, Susanne
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Meyer, Sebastian  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Grüger, Heinrich  
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Conference
Workshop "Mikro- und Nanotechnologien für die angewandte Spektroskopie" 2017  
Publication available upon request:
bibliothek@ipms.fraunhofer.de
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
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