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Mixed-level test generation for synchronous sequential circuits using the FORGBUSTER-algorithms
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1996
Journal Article
Title
Mixed-level test generation for synchronous sequential circuits using the FORGBUSTER-algorithms
Author(s)
Gläser, U.
Vierhaus, H.T.
Journal
IEEE transactions on computer-aided design of integrated circuits and systems
DOI
10.1109/43.494704
Language
English
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