• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Electroluminescence efficiency of InGaN light emitting diodes: Dependence on AlGaN:Mg electron blocking layer width and Mg doping profile
 
  • Details
  • Full
Options
2003
Journal Article
Title

Electroluminescence efficiency of InGaN light emitting diodes: Dependence on AlGaN:Mg electron blocking layer width and Mg doping profile

Other Title
Elektrolumineszenzeffizienz von InGaN Leuchtdioden: Abhängigkeit von der Dicke der AlGaN: Mg Elektronenbarriere und dem Mg Dotierprofil
Abstract
The influence of the Mg doping profile on the luminescence performance of InGaN light emitting diodes with an emission wavelength of 395 nm has been investigated. An increased spread of the Mg doping atoms towards the InGaN quantum well active region results in thermal quenching of the photoluminescence and electroluminescence intensity, and thus in a lower output power at 20 mA of the devices at room temperature. Further, the output power-versus current characteristics become increasingly superlinear, indicating that Mg introduces nonradiative recombination centers in the InGaN quantum well active region.
Author(s)
Stephan, T.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Köhler, Klaus  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Kunzer, Michael  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schlotter, P.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Wagner, J.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Physica status solidi. C  
DOI
10.1002/pssc.200303439
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • light emitting diode

  • Leuchtdiode

  • diffusion

  • (AlGaIn)N

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024