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  4. Towards the Automation of Non-destructive Fault Recognition: Enhancement of Robustness and Accuracy Through AI Powered Acoustic and Thermal Signal Analysis in Time, Frequency- and Time-Frequency Domains
 
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2024
Journal Article
Title

Towards the Automation of Non-destructive Fault Recognition: Enhancement of Robustness and Accuracy Through AI Powered Acoustic and Thermal Signal Analysis in Time, Frequency- and Time-Frequency Domains

Abstract
Non-destructive inspection and analysis techniques are crucial for quality assessment and defect analysis in various industries. They enable for screening and monitoring of parts and products without alteration or impact, facilitating the exploration of material interactions and defect formation. With increasing complexity in microelectronic technologies, high reliability, robustness and thus, successful failure analysis is essential. Machine learning (ML) approaches have been developed and evaluated for the analysis of acoustic echo signals and time-resolved thermal responses for assessing their ability for defect detection. In the present paper different ML architectures were evaluated, including 1D and 2D convolutional neural networks (CNNs) after transforming time domain data into the spectral- and wavelet domains. Results showed that 2D CNNs processing data in wavelet domain representation performed best, however at the expense of additional computational effort. Furthermore, ML-based analysis was explored for lock-in thermography to detect and locate defects in the axial dimension based on thermal emissions. While promising, further research is needed to fully realize its potential.
Author(s)
Brand, Sebastian
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Altmann, Frank  
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Hollerith, Christian
Infineon Technologies AG
Große, Christian
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Kögel, Michael
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Gounet, Pascal
STMicroelectronics SA, France
Journal
Journal of Failure Analysis and Prevention  
Project(s)
Zuverlässige Mikroelektronik durch KI-basierte Fehleranalyse. Teilvorhaben: Intelligente Methoden auf der Basis des maschinellen Lernens zur Unterstützung der Fehleranalytik  
Funder
Bundesministerium für Bildung und Forschung -BMBF-
Open Access
File(s)
Download (2.31 MB)
Rights
CC BY 4.0: Creative Commons Attribution
DOI
10.1007/s11668-024-02030-5
10.24406/publica-6355
Additional link
Full text
Language
English
Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWS  
Keyword(s)
  • Acoustic microscopy

  • AI

  • Complex failures

  • Lock-in thermography

  • Microelectronics failure analysis

  • Non-destructive fault isolation

  • Non-destructive testing (NDT)

  • Quality control

  • Signal analysis

  • Thermal analysis

  • Non-Destructive Defect Localization

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