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  4. Analysis of the Reliability of Ferroelectric Field Effect Transistors in Combination with Crossbar Circuits for Neuromorphic Computing
 
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2020
Diploma Thesis
Title

Analysis of the Reliability of Ferroelectric Field Effect Transistors in Combination with Crossbar Circuits for Neuromorphic Computing

Thesis Note
Dresden, TU, Dipl.-Arb., 2020
Author(s)
Hoffmann, Tudor
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Advisor(s)
Kämpfe, Thomas  orcid-logo
Messaris, Ioannis
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
Publishing Place
Dresden
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
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