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  4. Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods
 
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2022
Conference Paper
Title

Detection of Defects on Irregularly Structured Surfaces using Supervised and Semi-Supervised Learning Methods

Abstract
In the manufacture of real wood products, defects can quickly occur during the production process. To quickly sort out these defects, a system is needed that finds damage in the irregularly structured surfaces of the product. The difficulty in this task is that each surface is visually different and no standard defects can be denned. Thus, damage detection using correlation does not work, so this paper will test different machine learning methods. To evaluate different machine learning methods, a data set is needed. For this reason, the available samples were recorded manually using a static fixed camera. Subsequently, the images were divided into sub-images, which resulted in a relatively small data set Next, a convolutional neural network (CNN) was constructed to classify the images. However, this approach did not lead to a generalized solution, so the dataset was hashed using the a- and pHash. These hash values were then trained with a fully supervised system that will later serve as a reference model, in the semi-supervised learning procedures. To improve the supervised model and not have to label every data point, semi-supervised learning methods are used in the following. For this purpose, the CEAL method (wrapper method) is considered in the first and then the Π-Model (intrinsically semi-supervised).
Author(s)
Sander, Tom
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Lange, Sven  
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Hilleringmann, Ulrich
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Geneiß, Volker
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Hedayat, Christian  
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Kuhn, Harald  
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Mainwork
Smart Systems Integration, SSI 2022. Proceedings  
Conference
Smart Systems Integration Conference 2022  
DOI
10.1109/SSI56489.2022.9901433
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
Keyword(s)
  • CNN

  • Hashing

  • Machine Learning

  • semi-supervised learning

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