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  4. Method to determine the sticking coefficient of precursor molecules in atomic layer deposition
 
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2009
Journal Article
Title

Method to determine the sticking coefficient of precursor molecules in atomic layer deposition

Abstract
A method to determine the sticking coefficient of precursor molecules used in atomic layer deposition (ALD) will be introduced. The sticking coefficient is an interesting quantity for comparing different ALD processes and reactors but it cannot be observed easily. The method relies on free molecular flow in nanoscale cylindrical holes. The sticking coefficient is determined for tetrakis(dimethylamino) titanium in combination with ozone. The proposed method can be applied independent of the type of reactor, precursor delivery system and precursors.
Author(s)
Rose, M.
Bartha, J.W.
Journal
Applied surface science  
DOI
10.1016/j.apsusc.2009.02.055
Language
English
CNT  
Fraunhofer-Institut für Keramische Technologien und Systeme IKTS  
Keyword(s)
  • atomic-layer-deposition

  • surface chemistry

  • thin film

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