• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Modeling of influencing factors driving thermal runaway in 9xx-nm high-power laser diodes
 
  • Details
  • Full
Options
2021
Conference Paper
Title

Modeling of influencing factors driving thermal runaway in 9xx-nm high-power laser diodes

Abstract
In this work, we use a multiphysical model of a laser diode to investigate the influence of initial damage location, current, temperature dependence of material properties and facet overhang on the thermal runaway behavior and show a first experimental validation of the model.
Author(s)
Adams, Martin  
Fraunhofer-Institut für Lasertechnik ILT  
Holly, Carlo  
Rauch, Simon  
Schwarz, Thomas  
Fraunhofer-Institut für Lasertechnik ILT  
Traub, Martin  
Fraunhofer-Institut für Lasertechnik ILT  
Mainwork
27th International Semiconductor Laser Conference, ISLC 2021  
Conference
International Semiconductor Laser Conference (ISLC) 2021  
DOI
10.1109/islc51662.2021.9615699
Language
English
Fraunhofer-Institut für Lasertechnik ILT  
Keyword(s)
  • semiconductor device modeling

  • temperature dependence

  • semiconductor lasers

  • laser modes

  • diode lasers

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024