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  4. Determination of suitable mHEMT transistor dimensioning for power amplification at 210 GHz by comprehensive measurements
 
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2010
Conference Paper
Title

Determination of suitable mHEMT transistor dimensioning for power amplification at 210 GHz by comprehensive measurements

Abstract
The properties of various mHEMT technologies and their advantages for millimeter-wave (mmW) power amplification are presented. An experimental determination of the most suitable transistor technology (i.e. gate-length), transistor size (i.e. number of gate-fingers and gate-width) and transistor bias is taken. The advantages of the different technologies are pointed out. The most suitable combination of gate-length, number of fingers, gate-width and bias for obtaining maximum gain, maximum output power and maximum power added efficiency at a given frequency of 210 GHz is determined.
Author(s)
Diebold, S.
Kallfass, I.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Massler, Hermann
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Leuther, Arnulf  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Tessmann, Axel  orcid-logo
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Pahl, P.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Koch, S.
Siegel, M.
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Mainwork
5th European Microwave Integrated Circuits Conference, EuMIC 2010. Proceedings  
Conference
European Microwave Integrated Circuits Conference (EuMIC) 2010  
European Microwave Week 2010  
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • MMIC

  • millimeter wave

  • power amplifier

  • MHEMT

  • technology comparison

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