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T-Ellipsometry - a new method for the characterization of thin film thermophysical properties
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1999
Book Article
Title
T-Ellipsometry - a new method for the characterization of thin film thermophysical properties
Author(s)
Kahle, O.
Uhlig, C.
Bauer, M.
Mainwork
Materials mechanics, fracture mechanics, micro mechanics
Language
English
EPC
