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  4. Microstructure Characterization and Modifying of Materials by Focused Ion Beam Techniques
 
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2005
Seminar Paper
Title

Microstructure Characterization and Modifying of Materials by Focused Ion Beam Techniques

Thesis Note
Nancy, Ecole Européenne d'Ingénieur en Génie des Matériaux, Studienarbeit, 2005
Author(s)
Bernland, K.
Publishing Place
Saarbrücken
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • FIB

  • test flaw

  • diamond like carbon layer

  • subsurface defect

  • deposition

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