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  4. Modeling the leakage current for potential induced degradation
 
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2013
Conference Paper
Title

Modeling the leakage current for potential induced degradation

Abstract
The climatic conditions play an important role for a degradation mechanism of photovoltaic modules, known as potential induced degradation (PID). The influence of ambient humidity, precipitation and temperature on the leakage current has been investigated with high voltage stress in two different climate regions. This work focusses on one of them (Freiburg, Germany) It was found out, that for this test site, rain seems to be a serious problem as a conductive layer is established that leads to a high leakage current. A temperature dependency such as found in indoor test was found as well.
Author(s)
Hoffmann, Stephan
Köhl, Michael
Mainwork
28th European Photovoltaic Solar Energy Conference and Exhibition, EU PVSEC 2013. Proceedings. DVD-ROM  
Conference
European Photovoltaic Solar Energy Conference and Exhibition (EU PVSEC) 2013  
DOI
10.4229/28thEUPVSEC2013-4AV.5.48
Language
English
Fraunhofer-Institut für Solare Energiesysteme ISE  
Keyword(s)
  • Photovoltaische Module

  • Systeme und Zuverlässigkeit

  • Photovoltaische Module und Kraftwerke

  • Photovoltaische Module - Systeme und Zuverlässigkeit

  • Gebrauchsdauer von Modulen und Materialien

  • Gebrauchsdaueranalyse und Umweltsimulation

  • PID

  • reliability

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