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  4. Advanced Vacuum Wafer Drying for Thermal Laser Separation Dicing Assessment. Results from European collaborative SEAL project
 
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2013
Conference Paper
Title

Advanced Vacuum Wafer Drying for Thermal Laser Separation Dicing Assessment. Results from European collaborative SEAL project

Abstract
Based on recent progress on laser-based wafer dicing equipment and process, the partners adixen, Fraunhofer IISB and JENOPTIK investigated the use of a vacuum based decontamination process to dry and to decontaminate the substrate surface of the diced wafers from water residuals, which are a side-effect of the TLS (thermal laser separation) approach. The decontamination process was achieved by using an adixen vacuum drying module prototype further to the JENOPTIK TLS dicing process. Within the frame of the European collaborative project SEAL, supported by the European Commission, experimental assessment was conducted by Fraunhofer IISB (research institution) together with JENOPTIK and Adixen.
Author(s)
Le Barillec, Olivier
Davenet, Magali
Bellet, B.
Koitzsch, Matthias
Lewke, Dirk
Schellenberger, Martin  
Zühlke, Hans-Ulrich
Mainwork
Ultra clean processing of semiconductor surfaces XI  
Conference
International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS) 2012  
Open Access
DOI
10.4028/www.scientific.net/SSP.195.252
Additional full text version
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Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
Keyword(s)
  • dicing process

  • drying

  • decontamination

  • manufacturing

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