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  4. Fatigue Life Prediction and Analysis of Wafer Level Packages with SnAgCu Solder Balls
 
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2006
Conference Paper
Title

Fatigue Life Prediction and Analysis of Wafer Level Packages with SnAgCu Solder Balls

Author(s)
Dudek, R.
Rzepka, S.
Dobritz, S.
Döring, R.
Kreißig, K.
Wiese, S.
Michel, B.
Mainwork
1st Electronics Systemintegration Technology Conference, ESTC 2006. Vol.2  
Conference
Electronics Systemintegration Technology Conference (ESTC) 2006  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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