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Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors
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2003
Conference Paper
Title
Electrical characterization of zirconium silicate films obtained from novel MOCVD precursors
Author(s)
Lemberger, M.
Paskaleva, A.
Zürcher, S.
Bauer, A.J.
Frey, L.
Ryssel, H.
Mainwork
Dielectrics in microelectronics, WoDiM 2002
Conference
Workshop on Dielectrics in Microelectronics (WoDiM) 2002
DOI
10.1016/S0026-2714(03)00180-X
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB