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  4. Comparative study of n-LIGBT and n-LDMOS structures on 4H-SiC
 
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2013
Conference Paper
Title

Comparative study of n-LIGBT and n-LDMOS structures on 4H-SiC

Abstract
N-LDMOS and n-LIGBT structures were manufactured with the same dimensions on a 4H-SiC wafer in order to allow for a direct comparison. The comparison of the devices includes output and transfer characteristics, blocking characteristics, and temperature behavior.
Author(s)
Häublein, V.  
Temmel, G.
Mitlehner, H.
Rattmann, G.  
Strenger, C.
Hürner, A.
Bauer, A.J.
Ryssel, H.
Frey, L.
Mainwork
Silicon Carbide and Related Materials 2012  
Conference
European Conference on Silicon Carbide and Related Materials (ECSCRM) 2012  
DOI
10.4028/www.scientific.net/MSF.740-742.887
Language
English
Fraunhofer-Institut für Integrierte Systeme und Bauelementetechnologie IISB  
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