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  4. Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
 
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1999
Conference Paper
Title

Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions

Author(s)
Mergens, M.
Wilkening, W.
Mettler, S.
Wolf, H.
Stricker, A.
Fichtner, W.
Mainwork
Electrical Overstress/Electrostatic Discharge Symposium 1999. Proceedings  
Conference
Electrical Overstress Electrostatic Discharge Symposium 1999  
DOI
10.1109/EOSESD.1999.818983
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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