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Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
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1999
Conference Paper
Title
Analysis and compact modeling of lateral DMOS power devices under ESD stress conditions
Author(s)
Mergens, M.
Wilkening, W.
Mettler, S.
Wolf, H.
Stricker, A.
Fichtner, W.
Mainwork
Electrical Overstress/Electrostatic Discharge Symposium 1999. Proceedings
Conference
Electrical Overstress Electrostatic Discharge Symposium 1999
DOI
10.1109/EOSESD.1999.818983
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM