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  4. A 20W CMOS/LDMOS All-Digital Transmitter with Dynamic Retiming and Glitch-Free Phase Mapper, Achieving 68%/62% Peak Drain/System Efficiency
 
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2025
Conference Paper
Title

A 20W CMOS/LDMOS All-Digital Transmitter with Dynamic Retiming and Glitch-Free Phase Mapper, Achieving 68%/62% Peak Drain/System Efficiency

Abstract
Base stations account for 73% of wireless-operators' energy consumption, mainly dominated by their analog-PA-based TXs [1]. All-digital transmitters (DTXs), leveraging custom low-VT RF-power technologies [2], offer substantial energy savings by using switching operation and completely eliminating quiescent currents. In addition, DTXs enable extreme bandwidths since their circuit topology is frequency-agile up to the (power combining) output-matching network. To date, no high-power, high-efficiency DTX solutions have been reported that offer RF-power levels required for mMIMO base stations (Pavg>3W), with the essential fine-gate segmentation and glitch-free operation to support wideband modulated signals. In this work, an 8-phase multi-phase (MP) DTX upconversion with dynamic retiming and a glitch-free phase-mapper operation is proposed (Fig. 5.8.1). The required output power, resolution, and sampling speed are achieved via a high-density flip-chip DTX approach with a high-speed DTX controller placed on a custom low-VT LDMOS MMIC featuring power switch banks with in-finger gate segmentation (Fig. 5.8.1).
Author(s)
Mul, Dieuwert Peter Nicolaas
Delft University of Technology
Bootsman, Rob J.
Delft University of Technology
Beikmirza, Mohammadreza
Delft University of Technology
El Boustani, Ossama
Delft University of Technology
Shen, Yiyu
Delft University of Technology
Maassen, Daniel
Ampleon
Velzen, Bart van
Ampleon
Rousstia, Mohadig Widha
Ampleon
Koster, Ronald
Ampleon
Gajadharsing, John R.
Ampleon
Fritzsch, Thomas  
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Alavi, Morteza S.
Delft University of Technology
Vreede, Leo Cornelis Nicolaas de
Delft University of Technology
Mainwork
IEEE International Solid-State Circuits Conference, ISSCC 2025. Digest of technical papers  
Conference
International Solid-State Circuits Conference 2025  
DOI
10.1109/ISSCC49661.2025.10904650
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
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