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Nanoscale resolution deformation measurements at crack tips of nanostructured materials and interface cracks
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2008
Conference Paper
Title
Nanoscale resolution deformation measurements at crack tips of nanostructured materials and interface cracks
Author(s)
Keller, J.
Vogel, D.
Gollhardt, A.
Michel, B.
Mainwork
Nanotechnology 2008. NSTI Nanotechnology Conference and Trade Show. Technical proceedings. Vol.1: Materials, fabrication, particles, and characterization
Conference
Nanotechnology Conference and Trade Show (Nanotech) 2008
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM
