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2010
Conference Paper
Title

Test chips for advanced packaging

Abstract
Electronic packaging is advancing very fast and often a gap between availability of first functional chips and the need to develop their packaging processes and bill of materials exists. With the use of test chips and 200 mm test wafers from a qualified industrial wafer fab, this gap can be shrinked both in respect to timing as well as in gaining first production experience on high volume.
Author(s)
Reinert, W.
Kähler, D.
Mainwork
12th Electronics Packaging Technology Conference, EPTC 2010  
Conference
Electronics Packaging Technology Conference (EPTC) 2010  
DOI
10.1109/EPTC.2010.5702656
Language
English
Fraunhofer-Institut für Siliziumtechnologie ISIT  
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