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  4. Sips adsorption model for DNA sensing with AlGaN/GaN high electron mobility transistors
 
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2014
Journal Article
Title

Sips adsorption model for DNA sensing with AlGaN/GaN high electron mobility transistors

Abstract
This work presents an adsorption model based on the Sips isotherm for sensing different concentrations of DNA with open gate AlGaN/GaN high electron mobility field effect transistors (HEMTs). Probe-DNA was immobilized on the transistor gate before the application of target- DNA. Concentrations of 10(-15) to 10(-6) mol/L were tested. The sensor has a detection limit of 10(-12) mol/L and saturates after the addition of 10(-8) mol/L target-DNA.
Author(s)
Espinosa, N.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schwarz, S.U.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Cimalla, Volker  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Ambacher, Oliver  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
MRS online proceedings library. Online resource  
Conference
International Materials Research Congress (IMRC) 2014  
DOI
10.1557/opl.2015.131
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
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