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  4. An InGaAsP/InP double-heterojunction bipolar transistor for monolithic integration with a 1.5- mu m laser diode
 
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1985
Journal Article
Title

An InGaAsP/InP double-heterojunction bipolar transistor for monolithic integration with a 1.5- mu m laser diode

Abstract
A double-heterostructure InGaAsP/InP bipolar transistor is described which comprises a CdO film as a wide-gap emitter made by sputter deposition. A current gain as high as 40 has been achieved. The transistor can also be operated in an inverted mode with the CdO layer acting as collector. The main feature of this transistor is the structural compatibility with a 1.5- mu m double heterojunction (DH) laser allowing for monolithic integration.
Author(s)
Su, L.M.
Grote, N.
Kaumanns, R.
Katzschner, W.
Bach, H.G.
Journal
IEEE Electron Device Letters  
Language
English
Fraunhofer-Institut für Nachrichtentechnik, Heinrich-Hertz-Institut HHI  
Keyword(s)
  • bipolar transistors

  • gallium arsenide

  • gallium compounds

  • iii-v semiconductors

  • indium compounds

  • integrated optoelectronics

  • 1.5 micron laser diode

  • InGaAsP/InP double-heterojunction bipolar transistor

  • monolithic integration

  • CdO film

  • wide-gap emitter

  • sputter deposition

  • current gain

  • inverted mode

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