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  4. Investigations of thermocompression bonding with thin metal layers
 
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2011
Conference Paper
Title

Investigations of thermocompression bonding with thin metal layers

Abstract
In this study we successfully bonded silicon wafer substrates with metal based thermocompression technology. This technology has the advantage of inherent possibility of hermetic sealing and electrical contact. We used three different kinds of metals: gold, copper and aluminum. We will show the hermeticity, bonding strength and reliability of the different processes and compare the results.
Author(s)
Froemel, J.
Baum, Mario  
Wiemer, Maik  
Roscher, Frank  
Haubold, M.
Jia, C.
Geßner, Thomas  
Mainwork
16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS 2011  
Conference
International Solid-State Sensors, Actuators and Microsystems Conference 2011  
DOI
10.1109/TRANSDUCERS.2011.5969495
Language
English
Fraunhofer-Institut für Elektronische Nanosysteme ENAS  
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