• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Sem image denoising and contour image estimation using deep learning
 
  • Details
  • Full
Options
2020
Conference Paper
Title

Sem image denoising and contour image estimation using deep learning

Abstract
The estimation of line and contour geometries from real SEM images is a challenging problem due to the corruption of such images by Poisson noise, edge effects, and other SEM artifacts. We attempt simultaneous contour edge image prediction and SEM image denoising using a deep convolutional neural network LineNet2. To capture a range of edge effects in real SEM images, we simulate a training dataset of rough line SEM images with random edge effect parameters. We train the LineNet2 network on this training dataset and randomly rotate the images during the training phase. The retrained LineNet2 shows the ability to denoise real SEM images of line and contour geometries. We measure the line edge roughness (LER) parameter in isolated and dense regions of rough line images through multiple LER methods. Our experiments also demonstrate that the network can learn to recognize contour edges just by rotating rough line images.
Author(s)
Chaudhary, N.
Savari, S.A.
Brackmann, V.
Friedrich, M.
Mainwork
31st Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2020  
Conference
Advanced Semiconductor Manufacturing Conference (ASMC) 2020  
DOI
10.1109/ASMC49169.2020.9185250
Language
English
Fraunhofer-Institut für Photonische Mikrosysteme IPMS  
  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024