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  4. Vertical GaN-on-Tungsten High Voltage pn-Diodes from Sapphire-grown GaN Membranes
 
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2025
Journal Article
Title

Vertical GaN-on-Tungsten High Voltage pn-Diodes from Sapphire-grown GaN Membranes

Abstract
In this work, we demonstrate vertical GaN pn-diodes for high voltage applications initially grown and processed on 4” sapphire substrates and then transferred to 4” tungsten substrates to achieve a fully vertical conduction path. Laser lift-off was used to separate the GaN-membrane device structures from the initial sapphire substrate. The diodes show improved forward conduction after the transfer process with on-state resistance reduced from 1.52 ± 0.05 mΩ⋅cm2 to 1.15 ± 0.05 mΩ⋅cm2 and the blocking strength is not heavily compromised with its mean value reduced from 1015 ± 47 V to 988 ± 57 V. High device yields of the membrane transfer procedure underscores this cost-competitive vertical GaN device technology for high-power applications without the need of expensive GaN substrates.
Author(s)
Brusaterra, Enrico  
Ferdinand-Braun-Institut
Bahat Treidel, Eldad
Ferdinand-Braun-Institut
Deriks, Lutz
Fraunhofer-Institut für Lasertechnik ILT  
Danylyuk, Serhiy  
Fraunhofer-Institut für Lasertechnik ILT  
Brandl, E.
EV Group (Austria)
Bravin, Julian
EV Group (Austria)
Pawlak, M.
EV Group (Austria)
Külberg, Alex
Ferdinand-Braun-Institut
Schiersch, M.
Ferdinand-Braun-Institut
Thies, Andreas
Ferdinand-Braun-Institut
Hilt, Oliver  
Ferdinand-Braun-Institut, Freie Universität Berlin
Journal
IEEE Electron Device Letters  
DOI
10.1109/LED.2025.3540156
Language
English
Fraunhofer-Institut für Lasertechnik ILT  
Keyword(s)
  • Gallium Nitride

  • GaN

  • Vertical

  • pn-diode

  • GaN-on-Tungsten

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