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2023
Conference Paper
Titel
Terahertz technologies for non destructive testing
Abstract
Inline measurement systems in the terahertz range offer the potential to become an important part of quality assurance in the longer term. Despite the undisputed advantages in terms of contrast, sensitivity, measurement speed and resolution, there is a lack of suitable chip technologies for implementation. In the T-KOS project, a first basis for future terahertz line cameras was developed and verified.
Author(s)