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  4. X-Ray microtomography for materials characterization
 
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2016
Book Article
Title

X-Ray microtomography for materials characterization

Abstract
Since the 1970ies X-ray Computed Tomography (CT) has become a well-established and routinely used modality in modern diagnostic radiology (Hounsfield, 1973). Beyond that, since the late 1980ies, X-ray CT has emerged as a very important and wide spread tool in industrial inspection as well as in material sciences (Hanke, et al., 2008).
Author(s)
Hanke, Randolf  
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Fuchs, Theobald
Fraunhofer EZRT
Salamon, Michael
Fraunhofer EZRT
Zabler, Simon
Julius-Maximilians-University, Würzburg
Mainwork
Materials characterization using nondestructive evaluation (NDE) methods  
Language
English
Fraunhofer-Institut für Integrierte Schaltungen IIS  
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • Werkstoffprüfung

  • Simulation

  • Röntgentechnik

  • Röntgenquelle

  • Röntgendetektor

  • Rekonstruktion / Algorithmik

  • Physik

  • Messsystem

  • Lebensmittel

  • industrielle CT

  • industrielle BV

  • Gussteile

  • Defekterkennung

  • CT-Systeme

  • CT-Bildqualität

  • Computer-Tomografie (CT)

  • Computational Imaging

  • Artefakt

  • 3D Bildverarbeitung

  • 3D

  • 2D

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