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The effect of random dopant fluctuations on the minimum channel length of short-channel MOS transistors
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1997
Journal Article
Title
The effect of random dopant fluctuations on the minimum channel length of short-channel MOS transistors
Author(s)
Mikolajick, T.
Häublein, V.
Ryssel, H.
Journal
Applied physics. A
DOI
10.1007/s003390050516
Language
English
IIS-B