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  4. Exploring the thermal limit of GaN power devices under extreme overload conditions
 
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2017
Journal Article
Title

Exploring the thermal limit of GaN power devices under extreme overload conditions

Abstract
The performance of normally-off Gallium-Nitride (GaN) High-Electron-Mobility-Transistors (HEMTs) under extended short circuit operation is investigated. A thermal limit is found in the aluminium metallization, where at temperatures around 600°C a protrusion of the gate metal through the Inter-Level Dielectric (ILD) may form, short-circuiting gate and source metallization and thus resulting in a permanently-off failure state. The present work shows how this particular failure mode can be induced by extreme overload operation, and presents a Finite Element (FE) model which agrees with the experimental observations and gives insights in the mechanical stress-state developing in the device. The deeper thermo-mechanical understanding of the degradation mechanism suggests directions in order to improve the device's robustness.
Author(s)
Pribahsnik, F.P.
Nelhiebel, M.
Mataln, M.
Bernardoni, M.
Prechtl, G.
Altmann, F.
Poppitz, D.
Lindemann, A.
Journal
Microelectronics reliability  
Open Access
DOI
10.1016/j.microrel.2017.07.046
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