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1992
Conference Paper
Title

High performance gold plating for microdevices

Abstract
Tremendous improvements in the performance of microelectronic devices have been creating increased demands on fabrication control and consequent application of a synergistic operational model, high quality gold layers have been deposited from a sulfitic gold electrolyte. Periodic recording both of existing process data and resulting layer properties yielded a synergistic model to control the plating using SEM and acoustomicroscopy. Futher factors that influence quality of gold deposits (hardness, roughness, uniformity) could be optimized by flexible process control.
Author(s)
Gemmler, A.
Keller, W.
Mainwork
SUR/FIN '92. Bd.1  
Conference
American Electroplaters and Surface Finishers Society (Annual Technical Conference) 1992  
Language
English
Fraunhofer-Institut für Produktionstechnik und Automatisierung IPA  
Keyword(s)
  • Gold Plating

  • Goldüberzug

  • Leiterplatte

  • microelectronic device

  • Mikroelektronik

  • Plating

  • Schutzschicht

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